关键词:缺陷检测;YOLOv8n;BiFPN;SE注意力机制;轻量化;Lite-Head
中图分类号:TN911.73-34;TP391.4
文献标识码:A
文章编号:1004-373X(2026)11-0150-09
PCB defect detection algorithm based on improved (试读)...